Powerful Test Solutions for Advancing Al and Complex Computing Applications
Artificial Intelligence
Wafer Level Burn-in
and Test of GaN and SiC
Leader in Wide Bandgap Wafer-Level Burn-in
and Reliability Testing
Proven Wafer Level Solution for VCSELs and Optical Communications
Light
Burn-in and Test of Multi-Die Modules for Mobile and AR/VR
3D Sensors
Driver Assist
Addressing Growing Quality and Reliability
Requirements for Automotive Sensors
40+ Years Expertise in Semiconductor Test and Burn-in
Leadership
OUR PRODUCTS
Solutions
Aehr Test Systems provides complete production solutions across your product manufacturing flow to improve yield and reliability.
Markets
Wide-range of markets
Our solutions address the unique challenges of testing semiconductor devices used in artificial intelligence, data centers, automotive and industrial applications.
Automotive
IC growth driving increasing quality and reliability requirements.
Mobile
Cutting edge industrial design driving smallest, multi-function devices
Silicon Photonics
Light sensing during test and burn-in.
Memory & Logic
High parallelism solutions for HVM
Silicon Carbide and Gallium Nitride
Leader in silicon carbide and Gallium nitride die stress testing
Artificial Intelligence
Powerful test solutions for advancing Al and complex computing applications.
Automotive
IC growth driving increasing quality and reliability requirements.
Mobile
Cutting edge industrial design driving smallest, multi-function devices
Silicon Photonics
Light sensing during test and burn-in.
Memory & Logic
High parallelism solutions for HVM
Silicon Carbide
Leader in silicon carbide die stress testing
Artificial Intelligence
Powerful test solutions for advancing Al and complex computing applications.









