Category: Press Releases

Aehr Test Systems Announces $4 Million Order for ABTS™ Burn-In and Test Systems From Leading IC Manufacturer
  • July 26, 2016
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Aehr Test Systems to Participate in CEO Investor Summit 2016 in San Francisco on July 13
  • July 12, 2016
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Aehr Test Systems to Introduce Next Generation FOX-XP™ Test and Burn-in System at Semicon West in San Francisco July 12-14, 2016
  • July 11, 2016
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Aehr Test Systems Receives $4.5 Million Order For New FOX-XP™ Wafer Level Test and Burn-in System
  • June 7, 2016
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Aehr Test Systems Announces Follow-On Order For FOX-15™ WaferPak™ Contactors
  • April 4, 2016
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Aehr Test Systems to Exhibit at Burn-in and Test Strategies Workshop in Mesa, AZ March 6-9
  • March 7, 2016
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Aehr Test Systems Announces Delivery of New FOX-XP™ Wafer Level Test and Burn-in System
  • February 29, 2016
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Aehr Test Systems to Participate in the Fourth Annual Midtown CAP Investor Summit in New York
  • December 8, 2015
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Aehr Test Systems Announces First Order for New FOX-XP™ Wafer Level Test and Burn-in System
  • October 7, 2015
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Aehr Test Systems Announces Shipment of FOX-15™ Multi-Wafer Burn-In System for Production Test & Burn-In Application
  • September 15, 2015
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