Aehr Test Systems to Showcase Next Generation FOX-XP™ Test and Burn-in System at the 2016 International Test Conference in Fort Worth... November 14, 2016 Read More
Aehr Test Systems Announces Private Placement of Common Stock and Select Preliminary First Quarter Fiscal 2017 Financial Results September 23, 2016 Read More
Aehr Test Systems Announces Shipment of FOX-1P™ Single Wafer Test Systems to Lead Customer for Production Test and Burn-In Applicatio... September 1, 2016 Read More
Aehr Test Systems and Semics Inc. Announce Manufacturing and Development Partnership for FOX™ Wafer Handling and Investment by Semics... August 24, 2016 Read More
Aehr Test Systems Announces Shipment of FOX-1P™ Next Generation Single Wafer Test System July 26, 2016 Read More
Aehr Test Systems Announces $4 Million Order for ABTS™ Burn-In and Test Systems From Leading IC Manufacturer July 26, 2016 Read More
Aehr Test Systems to Participate in CEO Investor Summit 2016 in San Francisco on July 13 July 12, 2016 Read More
Aehr Test Systems to Introduce Next Generation FOX-XP™ Test and Burn-in System at Semicon West in San Francisco July 12-14, 2016 July 11, 2016 Read More
Aehr Test Systems Receives $4.5 Million Order For New FOX-XP™ Wafer Level Test and Burn-in System June 7, 2016 Read More
Aehr Test Systems to Exhibit at Burn-in and Test Strategies Workshop in Mesa, AZ March 6-9 March 7, 2016 Read More