Aehr Test Systems to Participate in the Fourth Annual Midtown CAP Investor Summit in New York
Aehr Test Systems Announces First Order for New FOX-XP™ Wafer Level Test and Burn-in System
Aehr Test Systems Announces Shipment of FOX-15™ Multi-Wafer Burn-In System for Production Test & Burn-In Application
Aehr Test Systems Appoints Kenneth B. Spink to Chief Financial Officer
Aehr Test Systems Added to Russell Microcap Index
Aehr Test Systems Announces $1.7 Million Follow- On Order for ABTS™ Burn-In and Test Systems from Leading IC Manufacturer
Aehr Test Systems to Participate in Seventh Annual CEO Investor Summit 2015
Aehr Test Systems Announces Order for ABTS™ Burn-In and Test System from Mobile Chipset Manufacturer in China
Aehr Test Systems Announces Achievement of NAND Flash Testing Milestone on FOX-XP™ Multi-Wafer Test and Burn-In System
Aehr Test Systems Announces Follow-On Order For FOX-15™ WaferPak™ Contactors